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Report Title | Summary |
Area Array Placement Yield Prediction | Analyzes placement challenges for miniature components. |
Warpage Modeling And Measurement | Links component size to assembly reliability issues. |
Metric | Impact on HDI PCBs |
Glass Transition Temperature (Tg) | Ensures thermal stability during reflow. |
Thermal Conductivity | Reduces hotspots in high-density designs. |
Challenge | Solution |
Dense routing constraints | Shrink interconnects and vias for improved trace routing. |
Layer count optimization | Use thin copper layers to prevent undercutting. |
Contamination risks | Implement cleanroom protocols for assembly. |
Technology | Function | Benefit |
AOI | Detects surface defects (misplaced components, solder bridges). | Cuts rework costs by 40% |
X-ray | Inspects hidden joints (BGA, CSP). | Identifies 99% of internal solder defects |
Aspect | Implementation |
Certifications | UL, CE, ISO-9001, RoHS compliance. |
Inspection | 3D X-ray, AOI, flying probe testing. |
Warranty | 1-year guarantee for manufacturing defects. |
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